Wide-Bandgap Semiconductor Thin Film Epitaxy Using Low-Pressure Metal-Organic Chemical Vapor Deposition (C. Li, P. Pirouz)
Failure Analysis of SiC Pressure Sensors (C. Li, P. Pirouz)
Characterization of Lattice Defects in SiC Bulk and Epilayer Materials Used in the Fabrication of High-Performance Electronic Devices (K. Speer, P. Pirouz)
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