|
Confocal microscopy enables to overcome
the diffraction limit of lateral resolution
inherent to conventional light-optical
microscopy and can deliver blur-free images
of thick specimens, suitable for 3D
reconstruction.
The confocal microscope Olympus BX62
with scan head FV 1000 and
photo-stimulated microspectrometer provides
a broad variety of optical imaging
modes:
- Laser scanning confocal imaging.
- Bright-field imaging.
- Dark-field imaging.
- Nomarski DIC (differential
interference contrast).
- Epifluorescene.
For the conventional imaging modes, a
mercury lamp can be used for reflected
light or epifluorescence imaging. A halogen
lamp is available for transmitted-light
work. A variety of high-quality objectives
are available. Oil immersion objectives are
available for the highest resolution
imaging. In laser scanning mode, six laser
lines are available for imaging or
fluorescence stimulation: 405, 458, 488,
515, 543, and 633 nm. Three imaging
channels are available in
reflected/fluoresced light mode, as well as
one transmitted channel. In addition,
fluoresced light may be directed to a
fiber-coupled 0.3 m Acton
high-resolution spectrometer equipped with
a Princeton Instruments PIXIS 100BR
thermoelectrically cooled CCD detector.
This high-resolution spectral capability
allow for residual stress measurements in
aluminum oxide
(Al2O3). Cr
impurities in
Al2O3 –
even in trace quantities –
generate a very sharp fluorescence peak,
the position of which which is sensitive to
stress. By measuring the very small shifts
in the wavelength of the fluorescent light,
it is possible to obtain three-dimensional
stress maps on the sub-micrometer length
scale. A three-axis motorized stage allows
for fully automated imaging. A Linkham
TS1500 hot stage is also available which
can operate at temperatures up to
1200 °C.
This material is based upon
work supported by the Department of Defense
(DoD) through the Office of Naval Research
(ONR) under contract no. CON047671.
Any opinions, findings, and conclusions or
recommendations expressed in this material
are those of the author(s) and do not
necessarily reflect the views of the
DoD/ONR.
|
